Konrad Krzysztof Szwedowicz
Ph.D. Technische Universiteit Eindhoven 2006
Dissertation:
3D-deflectometry: Fast nanotopography measurement for the semiconductor industry
Advisor 1: Herman C. W. Beijerinck
Advisor 2: Antonius Gregorius Tijhuis
No students known.
If you have additional information or corrections regarding this mathematician, please use the update form. To submit students of this mathematician, please use the new data form, noting this mathematician's MGP ID of 317778 for the advisor ID.